Product description: A product line featuring standardized microwave test benches designed for measuring the performance of radio-electronic components and microwave materials when tested in the L, S, C, X, Ku, and Ka frequency ranges.
Functional configuration of a microwave test bench:
- A generator unit that generates a probing signal in the desired frequency range
- A microwave measurement chamber that contains the component (material) being tested
- A processing unit whose outputs can be visualized on a personal computer
Operating principle: For each frequency range, there is a dedicated high-Q resonant measurement chamber developed to accommodate the microwave path component to be tested and, after the latter has been installed, to facilitate the measurements of the reflectance and transmittance characteristics thereof with an error of 5 % or less (if necessary, the error can be reduced by increasing the chamber’s own Q factor). Based on these data (as well as those obtained when calibrating the test bench using reference components), the processing unit can visualize the following microwave parameters in the selected frequency range: the values of complex impedance, insertion losses, and nonlinear distortion level (for microwave path components) or the values of dielectric permittivity and dielectric loss tangent (for microwave materials). When using a pulsed probing signal, it is possible to visualize the time (down to ns) of switching between the different states of the microwave path component. The proposed microwave test benches can be used for rapid output monitoring during the development and manufacture of electronic components (microwave varactor diodes and voltage-variable capacitors, semiconductor-based and microelectromechanical microwave key pads, microwave transistors and amplifiers) and microwave materials (solid dielectrics).
The devices make it possible to determine the microwave losses occurring in (i. e. evaluate the Q-factor of) semiconductor- and ferroelectric-based varactor diodes at various frequencies of the microwave range (1 GHz, 2 GHz, etc.) for various control voltages. The Q-factor measurement error does not exceed 5 % and practically does not depend on the frequency range. The high measurement accuracy is obtained by using high-Q (Q00 ≥ 2000) measuring resonators and providing a high degree of isolation (≥60 dB) between the resonator and the capacitor control circuits.
The devices make it possible to measure the capacitance of capacitors used in microwave circuits with an error not exceeding 0.1 %. The respective capacitance measurement range is between 0.1 pF and 10 pF.